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Quantification of Trace-Level Silicon Doping in AlxGa1–xN Films Using Wavelength-Dispersive X-Ray Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 05 July 2021, pp. 696-704
- Print publication:
- August 2021
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High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2217-2218
- Print publication:
- August 2015
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Crack Nucleation in AlGaN/GaN Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 743 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, L7.10
- Print publication:
- 2002
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