28 results
Use of Partial Scattering EDX Cross-Sections to Quantify Light Elements in the STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2448-2450
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- August 2022
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4D Analytical STEM with the pnCCD
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 220-221
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- August 2018
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Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 436-437
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- July 2017
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Analysis of Phase Difference Variations for Strong Dynamical Objects Using Wigner Distribution Deconvolution Ptychography
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 474-475
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- July 2017
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Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 432-433
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- July 2017
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A Comparison of Phase-retrieval Algorithms for Focused-probe Electron Ptychography
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 476-477
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- July 2017
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Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 512-513
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- July 2016
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4D-STEM Imaging With the pnCCD (S)TEM-Camera
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2211-2212
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- August 2015
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Advances in 2D, 3D and 4D STEM Image Data Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 770-771
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- August 2013
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Position-sensitive STEM detectors for high-sensitivity phase detection
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1180-1181
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- August 2013
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Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 538-539
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- August 2013
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Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1876-1877
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- August 2013
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How Flat is Your Detector? Non-Uniform Annular Detector Sensitivity in STEM Quantification
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1198-1199
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- August 2013
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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 532-533
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- July 2012
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Atomic resolution imaging of 2D nanomaterials
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1524-1525
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- July 2012
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Energy-Filtered Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1962-1963
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- July 2012
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Post-processing of STEM Data for Instability and Drift Compensation
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1232-1233
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- July 2012
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Focal Series Reconstruction in Annular Dark-Field STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1214-1215
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- July 2012
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Imaging Modes for Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 21 December 2007, pp. 82-88
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- February 2008
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Measuring the Hole State Anisotropy in MgB2 by High-Resolution Angular-Resolved Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 824-825
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- August 2003
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