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Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2108-2109
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- August 2014
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Characterization of Shales by Mass Spectrometry during Ion Milling
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1724-1725
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- August 2014
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Raising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM
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- Journal:
- Microscopy Today / Volume 19 / Issue 1 / January 2011
- Published online by Cambridge University Press:
- 11 January 2011, pp. 16-19
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- January 2011
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Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 522-523
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- August 2004
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Aberration correction: Some Advantages and Alternatives
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 22-23
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- August 2004
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Plasma Cleaning and Its Applications for Electron Microscopy
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- Microscopy and Microanalysis / Volume 5 / Issue 2 / March 1999
- Published online by Cambridge University Press:
- 31 July 2002, pp. 126-135
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- March 1999
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Applications of Plasma Cleaning for Electron Microscopy of Semiconducting Materials
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- MRS Online Proceedings Library Archive / Volume 523 / 1998
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- 10 February 2011, 31
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- 1998
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The Use of a Cold Gas Plasma for the Final Processing of Contamination-Free Tem Specimens
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- MRS Online Proceedings Library Archive / Volume 480 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 225
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- 1997
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