1 results
Structural Characterization of Lateral-grown 6H-SiC a/m-plane Seed Crystals by Hot Wall CVD Epitaxy
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1693 / 2014
- Published online by Cambridge University Press:
- 10 June 2014, mrss14-1693-dd01-03
- Print publication:
- 2014
-
- Article
- Export citation