11 results
SIMS Imaging Performed on Focused Ion Beam - based Platforms
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 944-946
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- August 2022
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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 30-31
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- August 2022
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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 34-35
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- August 2022
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In-situ multi-modal microscopy using finely focused ion and electron beams
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 308-309
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- August 2021
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New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 770-772
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- August 2021
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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1008-1010
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- August 2021
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Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 818-820
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- August 2020
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Advanced Analytical Capabilities on FIB Instruments Using SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 82-83
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- August 2020
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Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1972-1974
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- August 2020
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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1976-1977
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- August 2020
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Towards a High-Brightness Electron Impact Ion Source for Nano-Applications
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 94-99
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- June 2015
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