5 results
Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography Data
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 07 December 2020, pp. 28-35
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- February 2021
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Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 2 / April 2019
- Published online by Cambridge University Press:
- 04 February 2019, pp. 301-308
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- April 2019
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Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 20 February 2017, pp. 291-299
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- April 2017
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Nano-scale Characterization of Thin-Film Solar Cells
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 394-395
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- August 2014
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Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
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- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
- Print publication:
- May 2012
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