6 results
Assessing Hexagonal Boron Nitride Crystal Quality by Defect Sensitive Etching
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1518-1519
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- July 2017
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STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 339-340
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- August 2015
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Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 770-771
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- August 2014
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3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 318-319
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- August 2014
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Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1064-1065
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- August 2014
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Focused Ion Beam Slice-and-View Tomography and Correlative Electron Microscopy of Multiphase Meteorite Particles
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 870-871
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- August 2013
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