2 results
Interface Study of SiO2/ HfO2/SiO2 Stacks Used as InterPoly Dielectric for Future Generations of Embedded Flash Memories
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1252 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1252-I07-08
- Print publication:
- 2010
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- Article
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Metal Electrodes Work Function Measurement at Deca-Nanometer Scale using Kelvin Probe Force Microscope: a Step Forward to the Comprehension of Deposition Techniques Impact on Devices Electrical Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 917 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0917-E12-04
- Print publication:
- 2006
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- Article
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