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Estimation of the Electron Beam Energy Spread for TEM Information Limit
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 480-481
- Print publication:
- August 2002
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In Situ Transmission Electron Microscopy Observations of Silicidation Processes for Cobalt Thin Films Deposited on Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue 3 / June 1998
- Published online by Cambridge University Press:
- 28 July 2005, pp. 317-324
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- June 1998
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High Resolution TEM Imaging with Hollow-Cone Illumination
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1191-1192
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- August 1997
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Cross-Sectional Transmission Electron Microscopy of Si-Based Nanostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 441 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 773
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- 1996
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