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SIS-HOLZ Strain Measurements Through the Thickness of a SI Crystal
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 40-41
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- August 2018
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Phase and Atomic Displacement Profiles within Crystals Measured and Simulated using the Self-interference of Split HOLZ Lines
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1418-1419
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- July 2017
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Aberration-corrected self-interference of split higher order Laue zone line for measuring the z-dependent strain profile
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 16 January 2017, pp. 996-1008
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- 14 March 2017
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Strain Measurement through the Thickness of Crystal using DBI
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1965-1966
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- August 2015
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