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Nanoscale Visualization of Phase Transition in Melting of Sn–Bi Particles by In situ Hard X-ray Ptychographic Coherent Diffraction Imaging
Nozomu Ishiguro, Takaya Higashino, Makoto Hirose, Yukio Takahashi
Journal: Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
Published online by Cambridge University Press: 28 August 2020, pp. 878-885
Print publication: October 2020
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The phase transition in the melting of Sn–Bi eutectic solder alloy particles was observed by in situ hard X-ray ptychographic coherent diffraction imaging with a pin-point heating system. Ptychographic diffraction patterns of micrometer-sized Sn–Bi particles were collected at temperatures from room temperature to 540 K. The projection images of each particle were reconstructed at a spatial resolution of 25 nm, showing differences in the phase shifts due to two crystal phases in the Sn–Bi alloy system and the Sn/Bi oxides at the surface. By quantitatively evaluating the Bi content, it became clear that the nonuniformity of the composition of Sn and Bi at the single-particle level exists when the particles are synthesized by centrifugal atomization.

New transparent conductors anatase Ti1−xMxO2 (M=Nb,Ta): transport and optical properties
Yutaka Furubayashi, Taro Hitosugi, Yukio Yamamoto, Yasushi Hirose, Makoto Otani, Kiyomi Nakajima, Toyohiro Chikyow, Toshihiro Shimada, Tetsuya Hasegawa
Journal: MRS Online Proceedings Library Archive / Volume 905 / 2005
Published online by Cambridge University Press: 26 February 2011, 0905-DD02-01
Print publication: 2005
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We have discovered new transparent conducting oxides (TCOs), anatase Ti1-xMxO2 (M=Nb,Ta), in thin film form. Both films with 0.03 ≤ × ≤ 0.06 showed resistivity of 2−3 × 10−4 Ωcm and internal transmittance of ∼95% in the visible light region (40 nm in thickness), at room temperature. These values are comparable to those of typical TCOs, such as In2−xSnxO3 (ITO).

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