2 results
Advances in STEM and EELS: New Operation Modes, Detectors and Software
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 512-513
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 34-35
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation