2 results
Dependence of thermal stability of NiSi and Ni(Pt)Si /Si on crystal orientation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1079 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1079-N08-09
- Print publication:
- 2008
-
- Article
- Export citation
Detection of Characteristic Signals from As-Doped (less than 1 at.%) Regions of Silicon by Transmission Electron Microscopy and Convergent-beam Electron Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 338-339
- Print publication:
- August 2004
-
- Article
- Export citation