7 results
Characterization of Quantum well Structures Using Microscope-Spectrophotometry
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 111
- Print publication:
- 1993
-
- Article
- Export citation
Characterization of Ion Beam Synthesized Materials Using Microscope-Spectrophotometry
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 813
- Print publication:
- 1993
-
- Article
- Export citation
Fabrication and Evaluation of Ternary Co-Fe-Si Structures Produced by Ion Beam Synthesis
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 279 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 893
- Print publication:
- 1992
-
- Article
- Export citation
Dependence of Substrate Orientation on the Synthesis of CoSi2 Layers Formed by Ion Implantation & Rapid Thermal Annealing
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 224 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 103
- Print publication:
- 1991
-
- Article
- Export citation
Fabrication of High Quality Silicide Layers by Ion Implantation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 147 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 217
- Print publication:
- 1989
-
- Article
- Export citation
Synthesis of Buried Layers of β Sic in Single Crystal Silicon
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 107 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 473
- Print publication:
- 1987
-
- Article
- Export citation
Monitoring SIMOX Layer Properties and Implantation Temperature by Optical Measurements
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 107 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 133
- Print publication:
- 1987
-
- Article
- Export citation