4 results
Layer Stacking Determination in Topological Semimetal MoTe2 via STEM Imaging, Liquid He TEM, and Quantitative Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1746-1748
- Print publication:
- August 2022
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Structure-Property Relationships of Topological Insulator Nanomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 962-963
- Print publication:
- August 2019
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Supercluster-Coupled Crystal Growth in Metallic Glass Forming Liquids
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1410-1411
- Print publication:
- August 2019
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Microscopy and Chemical Analysis of Topological Insulator Bi2Se3 and Topological Crystalline Insulator SnTe Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1535-1536
- Print publication:
- August 2015
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