5 results
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 484-485
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- July 2016
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Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 02 October 2012, pp. 995-1009
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- October 2012
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Switching of Single Domain Permalloy Dots Observed by Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 524-525
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- August 2004
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Quantitative In-Situ TEM on Patterned Magnetic Specimens: Local Hysteresis Loops, Mono-domain Particles, Pinning and Dynamics.
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 496-497
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- August 2004
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Magnetic Switching of Permalloy Nanostructures observed by Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 214-215
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- September 2003
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