13 results
Direct Observation of Atomic Scale Diffusion Processes Using in situ HRSTEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1892-1894
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- August 2022
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In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 23 November 2020, pp. 65-73
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- February 2021
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A self-aligning microtensile setup: Application to single-crystal GaAs microscale tension–compression asymmetry- CORRIGENDUM
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- Journal:
- Journal of Materials Research / Volume 35 / Issue 10 / 28 May 2020
- Published online by Cambridge University Press:
- 02 March 2020, p. 1347
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- 28 May 2020
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Determination of the true projected contact area by in situ indentation testing — ERRATUM
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- Journal:
- Journal of Materials Research / Volume 34 / Issue 24 / 30 December 2019
- Published online by Cambridge University Press:
- 26 November 2019, p. 4086
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- 30 December 2019
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Determination of the true projected contact area by in situ indentation testing
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- Journal:
- Journal of Materials Research / Volume 34 / Issue 16 / 28 August 2019
- Published online by Cambridge University Press:
- 30 August 2019, pp. 2859-2868
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- 28 August 2019
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A self-aligning microtensile setup: Application to single-crystal GaAs microscale tension–compression asymmetry
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- Journal:
- Journal of Materials Research / Volume 34 / Issue 14 / 28 July 2019
- Published online by Cambridge University Press:
- 07 June 2019, pp. 2517-2534
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- 28 July 2019
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Room temperature stress relaxation in nanocrystalline Ni measured by micropillar compression and miniature tension
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- Journal:
- Journal of Materials Research / Volume 31 / Issue 8 / 28 April 2016
- Published online by Cambridge University Press:
- 01 April 2016, pp. 1085-1095
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- 28 April 2016
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Nanoindentation cracking in gallium arsenide: Part I. In situ SEM nanoindentation
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- Journal of Materials Research / Volume 28 / Issue 20 / 28 October 2013
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- 22 October 2013, pp. 2785-2798
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- 28 October 2013
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Nanoindentation cracking in gallium arsenide: Part II. TEM investigation
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- Journal:
- Journal of Materials Research / Volume 28 / Issue 20 / 28 October 2013
- Published online by Cambridge University Press:
- 22 October 2013, pp. 2799-2809
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- 28 October 2013
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Energy efficiency enhancements for semiconductors, communications, sensors and software achieved in cool silicon cluster project*
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- Journal:
- The European Physical Journal - Applied Physics / Volume 63 / Issue 1 / July 2013
- Published online by Cambridge University Press:
- 05 July 2013, 14402
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- July 2013
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Analysis of onset of dislocation nucleation during nanoindentation and nanoscratching of InP
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- Journal of Materials Research / Volume 27 / Issue 1 / 14 January 2012
- Published online by Cambridge University Press:
- 27 September 2011, pp. 320-329
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- 14 January 2012
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Free-volume dependent pressure sensitivity of Zr-based bulk metallic glass
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- Journal of Materials Research / Volume 24 / Issue 8 / August 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2697-2704
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- August 2009
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Local Electron Beam Induced Reduction and Crystallization in Electrochemically Deposited Amorphous TiO2 Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 950 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0950-D15-18
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- 2006
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