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58 results

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Structural Characterization of Gold Nanoparticles Using Liquid-phase 4D-STEM
Oliver Lin, Chang Liu, Wenxiang Chen, Jian-Min Zuo, Qian Chen
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 1860-1861

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August 2022
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Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM
Jeffrey Huang, Kayla Nguyen, Manohar Karigerasi, Kisung Kang, André Schleife, Daniel Shoemaker, David Cahill, Jian-Min Zuo, Pinshane Huang
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 474-475

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August 2022
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Autonomous Detection and Identification of Defects in Nanoscale Devices using Electron Diffraction Imaging
Jian-Min Zuo, Renliang Yuan, Jiong Zhang
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 1762-1763

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August 2022
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Fluctuation Cepstral STEM for Imaging Disordered Materials
Saran Pidaparthy, Haoyang Ni, Hanyu Hou, Daniel P. Abraham, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

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22 July 2022, pp. 450-452

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August 2022
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Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts
Haoyang Ni, Jian-min Zuo, Miaofang Chi
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

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22 July 2022, pp. 2130-2132

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August 2022
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4D-STEM Mapping of Nanoscale Structural Ordering in Cathode Materials
Wenxiang Chen, Xun Zhan, Reliant Yuan, Saran Pidaparthy, Zhichu Tang, Jian-Min Zuo, Qian Chen
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 2608-2609

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August 2022
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Seeing Electrons in Chemical Bonds – John Spence's Vision for Electron Microdiffraction and How to Realize it for Molecular Crystals
Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 2748-2749

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August 2022
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Cepstral Scanning Transmission Electron Microscopy Imaging of Disordered Crystals using Coherent Diffuse Scattering
Jian-Min Zuo, Yu-Tsun Shao, Haw-Wen Hsiao, Renliang Yuan, Qun Yang, Yang Hu
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 2664-2665

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August 2021
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Direct electron imaging of dislocation activities in nanocrystalline molybdenum nanopillars
Haw-Wen Hsiao, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 3104-3105

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August 2021
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Multi-Length Scale Characterization of Graphite Anodes from Fast-Charge Lithium-Ion Cells
Saran Pidaparthy, Daniel Abraham, Marco-Tulio Rodrigues, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 1974-1975

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August 2021
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Compressed Sensing Inspired Line Feature Detection for In-Situ Transmission Electron Microscopy
Haoyang Ni, Aram Yoon, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 2218-2219

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August 2021
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Angstrom-scale Magnetic Measurements of a Metallic Antiferromagnet with 4D-STEM
Jeffrey Huang, Kayla Nguyen, Manohar Karigerasi, Kisung Kang, André Schleife, Daniel Shoemaker, David Cahill, Jian-Min Zuo, Pinshane Huang
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 6-8

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August 2021
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Strategies for fast and reliable 4D-STEM orientation and phase mapping of nanomaterials and devices
Jian-Min Zuo, Xiurong Zhu
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 762-763

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August 2021
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Comparing different software packages for the mapping of strain from scanning precession diffraction data
Ian MacLaren, Emma Devine, Hristo Gergov, Gary Paterson, K. P. Harikrishnan, Benjamin Savitzky, Colin Ophus, Renliang Yuan, Jian-Min Zuo, Kirsten Forster, Gaja Kobe, Elizabeth Koppany, Kirsten McClymont, Anjelo Narendran, David Riley
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 2-5

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August 2021
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Machine Learning Based Precision Orientation and Strain Mapping from 4D Diffraction Datasets
Renliang Yuan, Jiong Zhang, Lingfeng He, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021

Published online by Cambridge University Press:

30 July 2021, pp. 1276-1278

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August 2021
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Understanding Li-O2 Battery Cathode Product Formation via Liquid Cell Electron Microscopy
Saran Pidaparthy, Chang Liu, Ryan Stephens, Qian Chen, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 3196-3197

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August 2020
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From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters
Jian-Min Zuo, Renliang Yuan, Haw-Wen Hsiao
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 966-967

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August 2020
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cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations
Jian-Min Zuo, Xiurong Zhu, Elaine Ang, Rahul Shah
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 1166-1167

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August 2020
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Multislice Electron Scattering Simulations for Angstrom-scale Magnetic Measurements with 4D-STEM
Kayla Nguyen, Jeffrey Huang, Manohar Karigerasi, Kisung Kang, Andre Schleife, Daniel Shoemaker, David Cahill, Jian-Min Zuo, Pinshane Huang
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 22-23

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August 2020
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Imaging Lattice Distortions in High Entropy Alloys at Multiple Length Scales Using Electron Nanodiffraction and 4D-STEM
Haw-Wen Hsiao, Yu-Tsun Shao, Renliang Yuan, Jian-Min Zuo
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 978-980

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August 2020
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