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Defect Characterization using Transmission Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1836-1837
- Print publication:
- August 2018
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Custom Scan Control and Time Resolved Signal Acquisition for High Resolution SEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 536-537
- Print publication:
- August 2018
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Prediction of Fatigue-Initiating Twin Boundaries in Polycrystalline Nickel Superalloys Informed by TriBeam Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1732-1733
- Print publication:
- July 2016
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