Small-angle X-ray scattering (SAXS), adsorption and nuclear magnetic resonance (NMR) techniques were used to determine the fractal dimensions (D) of 3 natural reference clays: 1) a kaolinite (KGa-2); 2) a hectorite (SHCa-1), and 3) a Ca-montmorillonite (STx-1). The surfaces of these clays were found to be fractal with D values close to 2.0. This is consistent with the common description of clay mineral surfaces as smooth and planar. Some surface irregularities were observed for hectorite and Ca-montmorillonite as a result of impurities in the materials. The SAXS method generated comparable D values for KGa-2 and STx-1. These results are supported by scanning electron microscopy (SEM). The SAXS and adsorption methods were found to probe the surface irregularities of the clays while the nuclear magnetic resonance (NMR) technique seems to reflect the mass distribution of certain sites in the material. Since the surface nature of clays is responsible for their reactivity in natural systems, SAXS and adsorption techniques would be the methods of choice for their fractal characterization. Due to its wider applicable characterization size-range, the SAXS method appears to be better suited for the determination of the fractal dimensions of clay minerals.

An indirect Fourier transformation applied to small-angle X-ray scattering data has been used to determine the thickness and surface properties of two common clay minerals. For an illite system, the particle density distribution function (PDDF) generated by the analysis gave a correct description of particle geometry, and the calculated electron density profile was in accordance with the theoretical electron density distribution for this mineral. This approach provides the opportunity to determine the thickness of fundamental particles of illite while avoiding the difficulties encountered in other methods. Both the PDDF and the electron density profile accurately predict the thickness of Na-montmorillonite layers, and the results suggest that an electron inhomogeneity exists at the interface of this mineral.

It has been suggested that interstratified illite-smectite (I-S) minerals are composed of aggregates of fundamental particles. Many attempts have been made to measure the thickness of such fundamental particles, but each of the methods used suffers from its own limitations and uncertainties. Small-angle X-ray scattering (SAXS) can be used to measure the thickness of particles that scatter X-rays coherently. We used SAXS to study suspensions of Na-rectorite and other illites with varying proportions of smectite. The scattering intensity (I) was recorded as a function of the scattering vector, q = (4 π/λ) sin(θ/2), where λ is the X-ray wavelength and θ is the scattering angle. The experimental data were treated with a direct Fourier transform to obtain the pair distance distribution function (PDDF) that was then used to determine the thickness of illite particles. The Guinier and Porod extrapolations were used to obtain the scattering intensity beyond the experimental q, and the effects of such extrapolations on the PDDF were examined. The thickness of independent rectorite particles (used as a reference mineral) is 18.3 Å. The SAXS results are compared with those obtained by X-ray diffraction peak broadening methods. It was found that the power-law exponent (α) obtained by fitting the data in the region of q = 0.1–0.6 nm−1 to the power law (I = I0q−α) is a linear function of illite particle thickness. Therefore, illite particle thickness could be predicted by the linear relationship as long as the thickness is within the limit where α <4.0.