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Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector
Xi Chen, Matthew R. Hauwiller, Abinash Kumar, Aubrey N. Penn, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
Published online by Cambridge University Press: 11 August 2020, pp. 938-943
Print publication: October 2020
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We report an approach to expand the effective number of pixels available to small, two-dimensional electron detectors. To do so, we acquire subsections of a diffraction pattern that are then accurately stitched together in post-processing. Using an electron microscopy pixel array detector (EMPAD) that has only 128 × 128 pixels, we show that the field of view can be expanded while achieving high reciprocal-space sampling. Further, we highlight the need to properly account for the detector position (rotation) and the non-orthonormal diffraction shift axes to achieve an accurate reconstruction. Applying the method, we provide examples of spot and convergent beam diffraction patterns acquired with a pixelated detector.

Expanding the Dimensions of a High Dynamic Range Detector with a Limited Number of Pixels via Scripting
Xi Chen, Tim B. Eldred, Mostafa Abdelhamid, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 212-213
Print publication: August 2019
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Explaining the Magnetic Properties of Oxygen Deficient LSMO Thin Films by iDPC
Aubrey N. Penn, Robbyn Trappen, Navid Mottaghi, Chih-Yeh Huang, Abinash Kumar, Mikel Holcomb, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 1748-1749
Print publication: August 2019
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In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging
Abinash Kumar, Rohan Dhall, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 1838-1839
Print publication: August 2019
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Quantification of Structural Correlation in STEM Images using the Projected Pair Distribution Function
Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 58-59
Print publication: August 2018
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A Novel Template for in-situ Microscopy to Reveal Ferroelectric Switching Mechanisms Across Length Scales
Rohan Dhall, Matthew Cabral, Abinash Kumar, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 1808-1809
Print publication: August 2018
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Depth Dependence Investigation of Manganese Charge State in Oxygen-deficient LSMO Thin Films
Aubrey N. Penn, Abinash Kumar, Robbyn Trappen, Guerau Cabrera, Mikel B. Holcomb, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 1476-1477
Print publication: August 2018
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Acquisition of a microscope for in situ studies of hard and soft matter
James M. LeBeau, Elizabeth C. Dickey, Veronica Augustyn, Dean L. Hesterberg, Ashley C. Brown
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 2332-2333
Print publication: August 2018
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Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
Everett D. Grimley, Sam Frisone, Tony Schenk, Min Hyuk Park, Chris M. Fancher, Thomas Mikolajick, Jacob L. Jones, Uwe Schroeder, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 184-185
Print publication: August 2018
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Imaging of Single Vacancies and Dopant Complexes in Aluminum Nitride
Tim B. Eldred, Joshua S. Harris, Jonathon N. Baker, Douglas L. Irving, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 22-23
Print publication: August 2018
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Extracting Thickness and Tilt From 4D-STEM Datasets to Model the Influence on ABF Images
Abinash Kumar, Celesta S. Chang, Everett D. Grimley, Zhen Chen, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
Published online by Cambridge University Press: 01 August 2018, pp. 216-217
Print publication: August 2018
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Correlating Local Chemistry and Local Cation Displacements in the Relaxor Ferroelectric PMN
Matthew J. Cabral, Shujun Zhang, Jocelyn Chi, Brian J. Reich, Elizabeth C. Dickey, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1616-1617
Print publication: July 2017
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Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging
J. Houston Dycus, Weizong Xu, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 512-513
Print publication: July 2017
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Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy
James M. LeBeau, Matthew Cabral, J. Houston Dycus, Everett Grimley, Shujun Zhang, Elizabeth Dickey
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1638-1639
Print publication: July 2017
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A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction
Weizong Xu, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 120-121
Print publication: July 2017
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Emergence of the Collective Oscillations in Electron Energy Loss Spectra of d-electrons in III-V Nitrides
Rohan Dhall, Houston Dycus, Derek Vigil Fowler, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 376-377
Print publication: July 2017
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Novel FIB-less Fabrication of Electrical Devices for in-situ Biasing
Rohan Dhall, Houston Dycus, Matthew Cabral, Everett Grimley, Weizong Xu, John Damiano, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1502-1503
Print publication: July 2017
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Numerical Modeling of Specimen Geometry for Quantitative Multiple Detector EDS
Weizong Xu, J. Houston Dycus, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 390-391
Print publication: July 2017
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Structure and Chemistry of Oxide Surface Reconstructions in III-Nitrides Observed using STEM EELS
J. Houston Dycus, Kelsey J. Mirrielees, Everett D. Grimley, Rohan Dhall, Ronny Kirste, Seiji Mita, Zlatko Sitar, Ramon Collazo, Douglas L. Irving, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1444-1445
Print publication: July 2017
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Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide
Weizong Xu, Preston C. Bowes, Everett D. Grimley, Douglas L. Irving, James M. LeBeau
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1596-1597
Print publication: July 2017
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Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector

Expanding the Dimensions of a High Dynamic Range Detector with a Limited Number of Pixels via Scripting

Explaining the Magnetic Properties of Oxygen Deficient LSMO Thin Films by iDPC

In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging

Quantification of Structural Correlation in STEM Images using the Projected Pair Distribution Function

A Novel Template for in-situ Microscopy to Reveal Ferroelectric Switching Mechanisms Across Length Scales

Depth Dependence Investigation of Manganese Charge State in Oxygen-deficient LSMO Thin Films

Acquisition of a microscope for in situ studies of hard and soft matter

Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

Imaging of Single Vacancies and Dopant Complexes in Aluminum Nitride

Extracting Thickness and Tilt From 4D-STEM Datasets to Model the Influence on ABF Images

Correlating Local Chemistry and Local Cation Displacements in the Relaxor Ferroelectric PMN

Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging

Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy

A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction

Emergence of the Collective Oscillations in Electron Energy Loss Spectra of d-electrons in III-V Nitrides

Novel FIB-less Fabrication of Electrical Devices for in-situ Biasing

Numerical Modeling of Specimen Geometry for Quantitative Multiple Detector EDS

Structure and Chemistry of Oxide Surface Reconstructions in III-Nitrides Observed using STEM EELS

Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide

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38 results