We have used neutron reflectivity to measure the concentration profile of carboxylic acid-terminated polystyrene at the liquid/solid interface. Two isotopic systems were studied: (1) deuterated polystyrene (DPS) in cyclohexane and (2) polystyrene (PS) in deuterated cyclohexane. Although measured at 24°C (a poor solvent condition), the high grafting density of PS tethered chains causes the chains to weakly stretch to 3-5 times its unperturbed dimension. Although of similar molecular weight, the height of the DPS layer is about 50% higher than that of the PS. In both systems, the volume fraction of polymer near the wall is ∼ 0.60. For the DPS system, reflectivity profiles can be simulated using a parabolic profile with a depletion layer at the silicon-liquid interface. However, in the PS system, no depletion is observed. Here, the shape. of the PS concentration profile is parabolic with a rounded tail.