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Ad Hoc Auto-Tuning of Aberrations Using High-Resolution STEM Images by Autocorrelation Function
Hidetaka Sawada, Masashi Watanabe, Izuru Chiyo
Journal: Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
Published online by Cambridge University Press: 31 July 2012, pp. 705-710
Print publication: August 2012
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A method for measurement of the aberration status from high-resolution dark-field images is developed using scanning transmission electron microscopy (STEM), called the Segmented Image Autocorrelation function Matrix (SIAM). The method employs an autocorrelation function from the segmented area in the defocused STEM images from an aligned crystalline specimen to measure the defocus and twofold astigmatism for the probe-forming system. The values measured using this method can be fed directly back to the instrument by changing the strength of the stigmator and the objective lens of the microscope. It is successfully demonstrated that the feedback system can automatically correct the defocus and twofold astigmatism of the microscope after several iterations using practical STEM images from an actual crystalline specimen.

Exceeding Conventional Resolution Limits in High-Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration
Sarah J. Haigh, Hidetaka Sawada, Kunio Takayanagi, Angus I. Kirkland
Journal: Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
Published online by Cambridge University Press: 06 July 2010, pp. 409-415
Print publication: August 2010
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Tilted illumination exit-wave restoration is compared for two aberration-corrected instruments at different accelerating voltages. The experimental progress of this technique is also reviewed and the significance of off-axial aberrations examined. Finally, the importance of higher order aberration compensation combined with careful correction of the lower order aberrations is highlighted.

Cs Corrector for Imaging
Hidetaka Sawada, Takeshi Tomita, Toshikatsu Kaneyama, Fumio Hosokawa, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Nobuo Tanaka, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne
Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
Published online by Cambridge University Press: 01 August 2004, pp. 976-977
Print publication: August 2004
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic and Electronic Structure Analysis of Active and Inactive Diamond Grain Boundaries
Hideki Ichinose, Hidetaka Sawada, Naoki Takayanagi
Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
Published online by Cambridge University Press: 01 August 2004, pp. 296-297
Print publication: August 2004
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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