29 results
Automation of TEM Alignment using Python Scripting
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2998-2999
- Print publication: August 2022
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Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2644-2647
- Print publication: August 2022
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Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2634-2635
- Print publication: August 2022
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In-situ TEM observation of the growth process of carbon nanomaterials by laser irradiation
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2344-2345
- Print publication: August 2021
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Development of High-Speed Scan System for Atomic Resolution STEM
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2710-2712
- Print publication: August 2021
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Development of Ultrahigh Resolution Objective Lens Enabling High Analytical Sensitivity
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 3126-3128
- Print publication: August 2020
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Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 2358-2359
- Print publication: August 2020
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Electron ptychography using an ultrafast direct electron detector
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 20-21
- Print publication: August 2019
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Development of Monochromatic Analytical Electron Microscope Equipped with Higher-Order Aberration Corrector
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 590-591
- Print publication: August 2019
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STEM and Elemental Analysis by EDS and EELS for Two-dimensional Atomic Structure Containing Au and Cu
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 1776-1777
- Print publication: August 2019
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Fast and Low-dose Electron Ptychography
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 224-225
- Print publication: August 2018
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Resolution Achievement of 40.5 pm in Scanning Transmission Electron Microscopy using 300 kV Microscope with Delta Corrector
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 120-121
- Print publication: August 2018
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Highly Depth-sensitive TEM Imaging of Graphene by using Monochromatic Electron Source at Low Accelerating Voltage
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 1610-1611
- Print publication: August 2018
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DualEELS at High Energy Losses: Exploring Lower Accelerating Voltages and Absolute Cross Sections
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 442-443
- Print publication: August 2018
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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
- Journal: Microscopy Today / Volume 25 / Issue 6 / November 2017
- Published online by Cambridge University Press: 27 October 2017, pp. 36-41
- Print publication: November 2017
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How to Set Up Your STEM for EELS at Very High Energy Losses
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 1080-1081
- Print publication: July 2017
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Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 318-319
- Print publication: July 2016
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Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 962-963
- Print publication: July 2016
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Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15-30 kV) with Monochromator
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 982-983
- Print publication: July 2016
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Development of a Monochromated and Aberration-Corrected Low-Voltage (S)TEM
- Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press: 23 September 2015, pp. 351-352
- Print publication: August 2015
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