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Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 2000-2001
- Print publication: August 2019
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Multi-order Scaling of High-throughput Transmission Electron Microscopy
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 1040-1041
- Print publication: August 2019
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Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS)
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 700-701
- Print publication: August 2019
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Creating Ultrafast Electron Pulses Using a Microfabricated Laser-Triggered Beam Blanker
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 648-649
- Print publication: August 2018
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