In this work we report on the effect of current-induced degradation and annealing on p-i-n amorphous silicon solar cells. Current-voltage curves and capacitance measurements under forward bias have been used to monitor the current-induced changes as a function of time. We found that the recovery rate increases with the annealing current, while the stabilized value of efficiency decreases. Comparison of short circuit current and capacitance evolution suggests that defect kinetics in the electronic gap occurs in a different way during degradation and annealing. This behavior can be modeled assuming a faster annealing of defects closest to the extended band and a slower annealing of mid-gap defects.

We present the Adjustable Threshold Color Detectors (ATCDs) based on stacked heterojunctions of amorphous silicon (a-Si:H) and silicon carbide (a-SiC:H). These devices work as bias-controlled photocurrent sources with different values of the voltage threshold depending on the wavelength of the incident radiation. The ATCDs detect the three fundamental chromatic components (blue, green, red) by varying the external voltage within a few Volts.