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Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 114-115
- Print publication:
- August 2018
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Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 404-405
- Print publication:
- August 2018
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Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1016-1017
- Print publication:
- August 2018
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