1 results
Characterizing the Two-Dimensional Doping Concentration inside Silicon-Nanowires Using Scanning Spreading Resistance Microscopy
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1178 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1178-AA05-03
- Print publication:
- 2009
-
- Article
- Export citation