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X-Ray Diffraction and Reflectance, Raman Scattering and Photoluminescence Characterization of Thermally Annealed Epitaxial SI1-XGEX Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 51
- Print publication:
- 1993
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- Article
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