5 results
Investigation of Fired and Non-fired Si-SiNx Interface Properties by Deep-level Transient Spectroscopy measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1210 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1210-Q05-04
- Print publication:
- 2009
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High Mobility Channel Materials and Novel Devices for Scaling of Nanoelectronics beyond the Si Roadmap
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1194 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1194-A07-01
- Print publication:
- 2009
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Catalytic Forming Gas Anneal on III-V/Ge MOS Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1194 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1194-A07-06
- Print publication:
- 2009
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A Comparison of Intrinsic Point Defect Properties in Si and Ge
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1070 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1070-E06-05
- Print publication:
- 2008
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On the Impact of Metal Impurities on the Carrier Lifetime in N-type Germanium
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- Journal:
- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 21 April 2011, 0994-F09-06
- Print publication:
- 2007
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