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19 results

  • Improved Yield and Data Quality in Atom Probe Tomography
  • R Ulfig, E Oltman, D Lenz, T Payne, T Prosa, D Larson
  • Journal: Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
  • Published online by Cambridge University Press: 08 April 2017, pp. 714-715
  • Print publication: July 2011
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
  • E Oltman, T Kelly, T Prosa, D Lawrence, D Larson
  • Journal: Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
  • Published online by Cambridge University Press: 08 April 2017, pp. 754-755
  • Print publication: July 2011
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Analytic Hitmap Equation of the Ideal Spherical Evaporator
  • B Geiser, E Oltman, D Larson, T Prosa, T Kelly
  • Journal: Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
  • Published online by Cambridge University Press: 08 April 2017, pp. 728-729
  • Print publication: July 2011
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Multivariate Statistical Analysis of Atom Probe Tomography Data
  • MR Keenan, VS Smentkowski, RM Ulfig, E Oltman, DJ Larson, TF Kelly
  • Journal: Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
  • Published online by Cambridge University Press: 01 August 2010, pp. 270-271
  • Print publication: July 2010
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Wide-Field-of-View Atom Probe Reconstruction
  • BP Geiser, DJ Larson, E Oltman, S Gerstl, D Reinhard, TF Kelly, TJ Prosa
  • Journal: Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
  • Published online by Cambridge University Press: 26 July 2009, pp. 292-293
  • Print publication: July 2009
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Background Removal Methods Applied to Atom Probe Data
  • E Oltman, R Ulfig, DJ Larson
  • Journal: Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
  • Published online by Cambridge University Press: 26 July 2009, pp. 256-257
  • Print publication: July 2009
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Improvements in Three-Dimensional Compositional Analysis of Complex Alloys
  • R Ulfig, E Oltman, DJ Larson, VS Smentkowski
  • Journal: Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
  • Published online by Cambridge University Press: 26 July 2009, pp. 294-295
  • Print publication: July 2009
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    Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009