3 results
Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1430-1431
- Print publication:
- July 2016
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Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 504-505
- Print publication:
- July 2016
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Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1079-1080
- Print publication:
- August 2015
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