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12 results

Electron Microscopy and Analysis of Martian Meteorite ALH84001 with MochiiISS-NL on the International Space Station
Christopher S. Own, K.T. Thomas-Keprta, S. Clemett, Z. Rahman, J. Martinez, L.S. Own, Z. Morales, R. Koene, D.R. Pettit
Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
Published online by Cambridge University Press: 22 July 2022, pp. 2712-2718
Print publication: August 2022
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Multi-order Scaling of High-throughput Transmission Electron Microscopy
Christopher S. Own, Theodore DeRego, Lawrence S. Own, Gerward Weppelman, Adrian A. Wanner, Sebastian Ströh, Eric Hammerschmith, Ashwin Vishwanathan, H. Sebastian Seung
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 1040-1041
Print publication: August 2019
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Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS)
James E. Martinez, Christopher S. Own, Matthew P. Galeano, Gerward Weppelman, Donald R. Pettit
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 700-701
Print publication: August 2019
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Portable Electron Microscopy and Microanalysis in Extreme Environments
Christopher S. Own, Matthew F. Murfitt, Lawrence S. Own, Jesse Cushing, James Martinez, Katherine Thomas-Keprta, Donald R. Pettit
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 1082-1083
Print publication: July 2017
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Developments in Reel-to-Reel Electron Microscopy Infrastructure
Christopher S. Own, Matthew F. Murfitt, Lawrence S. Own, Jesse Cushing
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 32-33
Print publication: July 2017
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Democratizing the micro-scale: A simplified, miniaturized SEM for K-12 and informal student scientists
Lindsey Own, Shaye Whitmer, Lawrence Own, Christopher S Own
Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
Published online by Cambridge University Press: 23 September 2015, pp. 1073-1074
Print publication: August 2015
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Reel-to-Reel Electron Microscopy: Latency-Free Continuous Imaging of Large Sample Volumes
Christopher S. Own, Matthew F. Murfitt, Lawrence S. Own, Derrick Brittain, Nuno da Costa, R. Clay Reid, David G. C. Hildebrand, Brett Graham, Wei-Chung Allen Lee
Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
Published online by Cambridge University Press: 23 September 2015, pp. 157-158
Print publication: August 2015
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Field-Portable Nano-Imaging: A New Tool for On-Demand Microscopy
Christopher S. Own, Matthew F. Murfitt, Lawrence S. Own
Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
Published online by Cambridge University Press: 23 September 2015, pp. 9-10
Print publication: August 2015
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Advances in Electron Crystallography Using Precession Electron Diffraction for ab initio Structure Analysis of Catalytic Materials
Wharton Sinkler, Christopher S Own, Laurence D Marks
Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
Published online by Cambridge University Press: 01 August 2004, pp. 40-41
Print publication: August 2004
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Erratum
Christopher S. Own, Arun K. Subramanian, Laurence D. Marks
Journal: Microscopy and Microanalysis / Volume 10 / Issue 3 / June 2004
Published online by Cambridge University Press: 01 June 2004, p. 396
Print publication: June 2004
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The following shows the correction to Figure 8 that appeared on page 103 of Microscopy and Microanalysis, 10:1, February 2004, in the article by Own et al. The three sections of Figure 8 were previously labeled as a, c, and c. The corrected figure below has the sections correctly labeled as a, b, and c.
The Editor and Cambridge University Press regret the inconvenience that this inadvertent error may have caused.

Quantitative Analyses of Precession Diffraction Data for a Large Cell Oxide
Christopher S. Own, Arun K. Subramanian, Laurence D. Marks
Journal: Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
Published online by Cambridge University Press: 22 January 2004, pp. 96-104
Print publication: February 2004
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Kinematical and two-beam calculations have been conducted and are compared to experimental precession data for the large unit cell crystal La4Cu3MoO12. Precession electron diffraction intensities are found to exhibit approximate two-beam behavior and demonstrate clear advantages over conventional SADP intensities for use in structure solution.