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86 results

Page 1 of 5

  • Modulating Electron Beam–Sample Interactions in Imaging and Diffraction Modes by Dose Fractionation with Low Dose Rates

  • Christian Kisielowski, Petra Specht, Steven J. Rozeveld, Joo Kang, Alyssa J. Fielitz, David Barton, Anthony C. Salazar, Oscar D. Dubon, Dirk Van Dyck, David F. Yancey
  • Journal:
    Microscopy and Microanalysis / Volume 27 / Issue 6 / December 2021
    Published online by Cambridge University Press:
    21 September 2021, pp. 1420-1430
    Print publication:
    December 2021
    • Article
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  • Technological opportunities are explored to enhance detection schemes in transmission electron microscopy (TEM) that build on the detection of single-electron scattering events across the typical spectrum of interdisciplinary applications. They range from imaging with high spatiotemporal resolution to diffraction experiments at the window to quantum mechanics, where the wave-particle dualism of single electrons is evident. At the ultimate detection limit, where isolated electrons are delivered to interact with solids, we find that the beam current dominates damage processes instead of the deposited electron charge, which can be exploited to modify electron beam-induced sample alterations. The results are explained by assuming that all electron scattering are inelastic and include phonon excitation that can hardly be distinguished from elastic electron scattering. Consequently, a coherence length and a related coherence time exist that reflect the interaction of the electron with the sample and change linearly with energy loss. Phonon excitations are of small energy (<100 meV), but they occur frequently and scale with beam current in the irradiated area, which is why we can detect their contribution to beam-induced sample alterations and damage.

  • TEM Characterization of Ball Milled CIS and CIGS Nanoparticles

  • I. I. Santana-Garcia, C. Kisielowski, H. A. Calderon
  • Journal:
    Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 2085-2086
    Print publication:
    August 2015
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  • Atom Dynamics at the Gas-Catalysts Interface with Atomic Resolution

  • C. Kisielowski, S. Helveg, G. Yuan, H. Frei
  • Journal:
    Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
    Published online by Cambridge University Press:
    27 August 2014, pp. 406-407
    Print publication:
    August 2014
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  • Cs Corrected Images and What You Don't See: Data Mining to the Physical Limits

  • D. Van Dyck, C. Kisielowski, F.-R. Chen
  • Journal:
    Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
    Published online by Cambridge University Press:
    09 October 2013, pp. 590-591
    Print publication:
    August 2013
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Effect of Electron Dose on Imaging of Ni@Pt Nanoparticles for Fuel Cells

  • F. Godinez-Salomon, O. Solorza-Feria, C. Kisielowski, H.A. Calderon
  • Journal:
    Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
    Published online by Cambridge University Press:
    09 October 2013, pp. 1532-1533
    Print publication:
    August 2013
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 1 of 5