Applying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.

A study was made of radial crack evolution in curved brittle layers on compliant support substrates. Three-dimensional boundary element analysis was used to compute the stepwise growth of radial cracks that initiate at the bottom surfaces of glass on polymeric support layers, from initiation to final failure. The algorithm calculates reconstituted displacement fields in the near-tip region of the extending cracks, enabling direct evaluation of stress-intensity factors. Available experimental data on the same material systems with prescribed surface curvatures were used to validate the essential features of the predicted crack evolution, particularly the stability conditions prior to ultimate failure. It was shown that the critical loads to failure diminish with increasing surface curvature. Generalization of the ensuing fracture mechanics to include alternative brittle-layer/polymer-substrate systems enabled an explicit expression for the critical load to failure in terms of material properties and layer thicknesses. Implications concerning practical layer systems, particularly dental crowns, are briefly discussed.

A preceding study of contact damage in a bilayer system consisting of a porcelain coating on a stiff Pd-alloy substrate is here expanded to investigate the role of substrate modulus and hardness. Bilayers are made by fusing the same dental porcelain onto Co-, Pd-, and Au-alloy metal bases. Indentations are made on the porcelain surfaces using spheres of radii 2.38 and 3.98 mm. Critical loads to initiate cone fracture at the top surface of the porcelain and yield in the substrate below the contact are measured as a function of porcelain thickness. Radial cracks form at the lower surface of the coating once the substrate yield is well developed. By virtue of its controlling role in the metal yield process, substrate hardness is revealed to be a key material parameter—substrate modulus plays a secondary role. A simple elasticitybased analysis for predetermining critical loads for a given brittle/plastic bilayer system is presented.

An analysis is made of contact damage in brittle coatings on metal substrates, using a case study of a dental porcelain coating of thickness between 0.1 and 1 mm fused onto a Pd alloy base, with spherical indenter of radii 2.38 and 3.98 mm. At large coating thicknesses (>300 μm), the first damage takes the form of surface-initiated transverse cone cracks outside the contact. At small coating thicknesses (<300 μm), the first damage occurs as yield in the substrate, with attendant formation of subsurface transverse median cracks in the coating. At high loads and thin coatings, both forms of transverse cracking occur, along with subsequent delamination of the ceramic/metal interface, signalling impending failure. Conditions for avoiding such transverse cracking are considered in terms of minimum coating thicknesses and maximum sustainable contact loads. General implications concerning the design of brittle coating systems for optimum damage resistance are considered, with special reference to dental crowns.

Transport, cleanup, and bioremediation properties of polychlorinated biphenyls (PCBs) bound to sediments depend on the specific components to which the PCBs are bound. Analysis of the sediment from Contaminant Cove on the St. Lawrence River by gas chromatography with an electron capture detector shows that the sediment contains 600 ppm PCBs. Previous work showed that there were both weak and strong binding of PCBs to sediment components, but gave no indication of which components were responsible for the binding.2 The average content of PCBs is below the limit of detectability by energy-dispersive x-ray microanalysis (EDX) for CI, but constituents which bind large quantities of PCBs could be detected. Sediment which is not contaminated with PCBs contains no detectable chlorine.

EDX analysis was performed on a JEOL JEM-4000FX, using a cryo-stage (operated at -160° C) and a Tracor TN5500 system.