9 results
STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2054-2056
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- August 2022
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Microanalysis Society Awards: 2022 Award Recipients
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- Journal:
- Microscopy Today / Volume 30 / Issue 4 / July 2022
- Published online by Cambridge University Press:
- 11 July 2022, pp. 16-18
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- July 2022
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Microanalysis Society Awards: 2021 Award Recipients
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- Microscopy Today / Volume 30 / Issue 1 / January 2022
- Published online by Cambridge University Press:
- 31 January 2022, pp. 15-17
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- January 2022
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Microanalysis Society Awards: 2020 Award Recipients
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- Journal:
- Microscopy Today / Volume 29 / Issue 4 / July 2021
- Published online by Cambridge University Press:
- 28 July 2021, pp. 11-13
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- July 2021
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Analysis of in situ Nanodiamonds in Organic Matter from Primitive Meteorites with Electron Energy-Loss Spectroscopy and Energy Dispersive X-ray Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2456-2457
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- August 2019
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Low Energy STEM-EELS Characterization of Primitive Organic Matter and Silicates in the Meteorite LAP 02342
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2074-2075
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- August 2018
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Nanoscale Variation in Carbonaceous Matter from Primitive Meteorites Revealed by Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2265-2266
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- August 2015
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Coordinated Electron and X-ray Microscopy of Cometary Organic Matter Collected by the NASA Stardust Mission.
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1694-1695
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- August 2014
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Using the Focused Ion Beam to Perform Serial Sectioning of Micron-Sized Particles for Coordinated Nanoscale Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1089 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1089-Y04-05
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- 2008
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