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Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching.*
- Journal: MRS Online Proceedings Library Archive / Volume 11 / 1981
- Published online by Cambridge University Press: 15 February 2011, 193
- Print publication: 1981
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