7 results
In Situ Lorentz Electron Microscopy Imaging of Skyrmions in Geometric Confined Structures
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 34-35
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- August 2019
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Atomic Resolution Imaging and Quantitative Elemental Mapping of the Misfit Dislocation Core Phase in Multicomponent Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 24-25
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- August 2018
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In Situ Lorentz Differential Phase Contrast STEM Characterization of Rashba Interaction on Skyrmion Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1900-1901
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- August 2018
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Structural and Magnetic Characterization of B20 Skyrmion Thin Films and Heterostructures Using Aberration-Corrected Lorentz TEM and Differential Phase Contrast STEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1732-1733
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- July 2017
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Structure-Properties Relations in III-Nitride Nanostructures for Optoelectronics
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1536-1537
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- July 2016
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Characterizing Epitaxial Growth of Nd2Ir2O7Pyrochlore Thin Films via HAADF-STEM Imaging and EDX
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1598-1599
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- July 2016
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Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 116-117
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- August 2014
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