Sample of natural Zr-silicate gel containing up to 13 wt.% U was characterized using scanning electron microscopy (SEM), X-ray powder diffraction (XRD), high resolution transmission electron microscopy (HRTEM) and electron microprobe analysis (EPMA) method. It was found that gel matrix is amorphous in general; however, it contains non-identified nanocrystallites. No separated oxide phases of U, Zr or Si were observed in a gel matrix. After sintering in air at 1400°C for 1 hour gel transformed largely into crystalline zircon, (Zr,U)SiO4. Uranium was not found in any other phases besides zircon. It was assumed that high chemical durability of natural Zr-P-U-Ti-silicate gel is caused by two competing processes which exist under self-irradiation conditions: 1) crystallization of the gel and 2) metamictization of the crystallized zircon and other phases.
Synthetic samples of Zr-silicate gel doped with Ce, U, Pu and Am were obtained and studied in comparison with natural samples. It was suggested to use artificial solid Zr-silicate gels for durable fixation of actinides for the goal of long-term or intermediate storage.