4 results
Correlative Electron Energy-Loss Spectroscopy Bandgap Mapping and DFT Modeling in AlGaN Diodes
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2010-2011
- Print publication:
- August 2022
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Defect analysis of star defects in GaN thin films grown on HVPE GaN substrates
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 916-917
- Print publication:
- August 2021
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Identification of Star Defects in Gallium Nitride with HREBSD and ECCI
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 2 / April 2021
- Published online by Cambridge University Press:
- 16 April 2021, pp. 257-265
- Print publication:
- April 2021
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Measuring the minority carrier diffusion length in n-GaN using bulk STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1842-1843
- Print publication:
- August 2018
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