Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We have developed an automated crystal orientation mapping (ACOM) procedure which uses a converged electron probe to collect diffraction patterns from multiple locations across a complex sample. We provide an algorithm to determine the orientation of each diffraction pattern based on a fast sparse correlation method. We demonstrate the speed and accuracy of our method by indexing diffraction patterns generated using both kinematical and dynamical simulations. We have also measured orientation maps from an experimental dataset consisting of a complex polycrystalline twisted helical AuAgPd nanowire. From these maps we identify twin planes between adjacent grains, which may be responsible for the twisted helical structure. All of our methods are made freely available as open source code, including tutorials which can be easily adapted to perform ACOM measurements on diffraction pattern datasets.

Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positions as each probe position must be simulated independently. Recently, the plane-wave reciprocal-space interpolated scattering matrix (PRISM) algorithm was developed to reduce calculation times for large STEM simulations. Here, we introduce a new method for STEM simulation: partitioning of the STEM probe into “beamlets,” given by a natural neighbor interpolation of the parent beams. This idea is compatible with PRISM simulations and can lead to even larger improvements in simulation time, as well requiring significantly less computer random access memory (RAM). We have performed various simulations to demonstrate the advantages and disadvantages of partitioned PRISM STEM simulations. We find that this new algorithm is particularly useful for 4D-STEM simulations of large fields of view. We also provide a reference implementation of the multislice, PRISM, and partitioned PRISM algorithms.

Single wall carbon nanotubes (SWCNTs) and liquid-phase exfoliated multilayer graphene (MLG) material thin films were assembled at a polarizable organic/water interface. A simple, spontaneous route to functionalize/decorate the interfacial assembly of MLG and SWCNTs with noble metal nanoparticles, at the interface between two immiscible electrolyte solutions (ITIES), is reported. The formation of MLG- or SWCNT-based metal nanocomposites was confirmed using various microscopic (scanning electron, transmission electron, and atomic force microscopy) and several spectroscopic (energy dispersive x-ray and Raman spectroscopy) techniques. Increasing the interfacial deposition time of the metal nanoparticles on the assembled low-dimensional carbon material increased the amount of the metal particles/structures, resulting in greater coverage of the MLG or SWCNTs with metal nanoparticles. This low-cost and convenient solution chemistry based impregnation method can serve as a means to prepare nanoscale carbonaceous material-based metal nanocomposites for their potential exploitation as electro-active materials, e.g., new generation catalysts or electrode materials.