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20 results

  • Ferroic twin domains in metal halide perovskites

  • Yongtao Liu, Alex Belianinov, Liam Collins, Roger Proksch, Anton V. Ievlev, Bin Hu, Sergei V. Kalinin, Olga S. Ovchinnikova
  • Journal: MRS Advances / Volume 4 / Issue 51-52 / 2019
  • Published online by Cambridge University Press: 23 September 2019, pp. 2817-2830
  • Print publication: 2019

  • An emerging family of materials—metal halide perovskites (MHPs)—have made incredible achievements in optoelectronics in the past decade. Owing to its potential role in optoelectronic properties, the ferroic state of MHPs has been investigated by lots of researchers. Here, we review the literature regarding investigations into possible ferroic behaviors in MHPs. We summarize the recent discoveries of ferroic twin domains in MHPs. We examine the ferroelasticity and the ferroelectricity of these twin domains. Several properties relevant to the twin domains are critically analyzed, including crystallographic structure, mechanical variation, chemical variation, etc. Finally, we discussed the effects of these domains on materials’ optoelectronic properties and their potential roles in photovoltaic action.

  • Noble gas ion beams in materials science for future applications and devices

  • Alex Belianinov, Matthew J. Burch, Songkil Kim, Shida Tan, Gregor Hlawacek, Olga S. Ovchinnikova
  • Journal: MRS Bulletin / Volume 42 / Issue 9 / September 2017
  • Published online by Cambridge University Press: 08 September 2017, pp. 660-666
  • Print publication: September 2017

  • Helium ion microscopy (HIM), enabled by a gas field ion source (GFIS), is an emerging imaging and nanofabrication technique compatible with many applications in materials science. The scanning electron microscope (SEM) has become ubiquitous in materials science for high-resolution imaging of materials. However, due to the fundamental limitation in focusing of electron beams, ion-beam microscopy is now being developed (e.g., at 20 kV the SEM beam diameter ranges from 0.5 to 1 nm, whereas the HIM offers 0.35 nm). The key technological advantage of the HIM is in its multipurpose design that excels in a variety of disciplines. The HIM offers higher resolution than the best available SEMs as well as the traditional gallium liquid-metal ion source (LMISs) focused ion beams (FIBs), and is capable of imaging untreated biological or other insulating samples with unprecedented resolution, depth of field, materials contrast, and image quality. GFIS FIBs also offer a direct path to defect engineering via ion implantation, three-dimensional direct write using gaseous and liquid precursors, and chemical-imaging options with secondary ion mass spectrometry. HIM covers a wide range of tasks that otherwise would require multiple tools or specialized sample preparation. In this article, we describe the underlying technology, present materials, relevant applications, and offer an outlook for the potential of FIB technology in processing materials.

  • Tutorial: Processing of Atomic Resolution Images and Multispectral Data

  • Stephen Jesse, Alex Belianinov
  • Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
  • Published online by Cambridge University Press: 04 August 2017, pp. 1394-1395
  • Print publication: July 2017
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