10 results
EELS Analysis of InGaN/GaN Heterostructures Using the Ga 3d Transitions in Epsilon 2
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 864-865
- Print publication: August 2004
-
- Article
- Export citation
Defect Analysis in InGaN/GaN Heterostructures by Combined EDX and CTEM Studies
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 582-583
- Print publication: August 2004
-
- Article
- Export citation
FEGSTEM Study of Fe-20Cr-5Al-0.046Y Model Alloy Oxidised at 1200° C
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 326-327
- Print publication: August 2004
-
- Article
- Export citation
High Spatial Resolution Mapping of the Effective Mass in GaInNAs
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 828-829
- Print publication: August 2004
-
- Article
- Export citation
Tuning the Energy of Split Surface Electron Energy-Loss Resonances Excited on a Multi-Wall Carbon Nanotube
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 868-869
- Print publication: August 2004
-
- Article
- Export citation
Problems Associated with High Spatial Resolution X-ray Mapping of Multi-Layer Coatings on Float Glass
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 646-647
- Print publication: August 2004
-
- Article
- Export citation
Quantitative Elemental Mapping Using Valance-Band Transitions in Epsilon2, Using Electron Energy Loss Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 866-867
- Print publication: August 2004
-
- Article
- Export citation
EEL Spectrum Imaging of Extended Defects in Diamond Using UHV Enfina in a Dedicated STEM
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 886-887
- Print publication: August 2004
-
- Article
- Export citation
EEL Analysis of La0.6Ca0.4CoO3 Perovskite Films for Air Based Batteries using UHV Enfina in a Dedicated STEM
- Journal: Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press: 01 August 2004, pp. 872-873
- Print publication: August 2004
-
- Article
- Export citation
X-ray Elemental Mapping of Multi-Component Steels
- Journal: MRS Online Proceedings Library Archive / Volume 589 / 1999
- Published online by Cambridge University Press: 10 February 2011, 87
- Print publication: 1999
-
- Article
- Export citation