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Reverse Engineering at the Atomic Scale: Competitive Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode
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- Journal:
- Microscopy Today / Volume 22 / Issue 5 / September 2014
- Published online by Cambridge University Press:
- 29 August 2014, pp. 12-19
- Print publication:
- September 2014
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Application of Atom Probe Tomography to Atomic Layer Deposited Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1028-1029
- Print publication:
- August 2013
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Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1014-1015
- Print publication:
- August 2013
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