4 results
Channel Strain Characterization in Semiconductor Device by Techniques Based on Transmission Electron Microscope
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 13 September 2011, mrss11-1349-dd04-03
- Print publication:
- 2011
-
- Article
- Export citation
Diffusion Barriers for Mobile Ions in 256M DRAMs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 229
- Print publication:
- 1999
-
- Article
- Export citation
Transient Enhanced Diffusion and Dose Loss of Indium in Silicon
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 568 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 205
- Print publication:
- 1999
-
- Article
- Export citation
Observation of Crystallization, Precipitation, and Phase Transformation Phenomena in Si Rich Titanium Silicide Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 398 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 463
- Print publication:
- 1995
-
- Article
- Export citation