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51 results

Page 1 of 3

  • A Method for Directly Correlating Site-Specific Cross-Sectional and Plan-View Transmission Electron Microscopy of Individual Nanostructures

  • Daniel K. Schreiber, Praneet Adusumilli, Eric R. Hemesath, David N. Seidman, Amanda K. Petford-Long, Lincoln J. Lauhon
  • Journal:
    Microscopy and Microanalysis / Volume 18 / Issue 6 / December 2012
    Published online by Cambridge University Press:
    12 November 2012, pp. 1410-1418
    Print publication:
    December 2012

  • A sample preparation method is described for enabling direct correlation of site-specific plan-view and cross-sectional transmission electron microscopy (TEM) analysis of individual nanostructures by employing a dual-beam focused-ion beam (FIB) microscope. This technique is demonstrated using Si nanowires dispersed on a TEM sample support (lacey carbon or Si-nitride). Individual nanowires are first imaged in the plan-view orientation to identify a region of interest; in this case, impurity atoms distributed at crystalline defects that require further investigation in the cross-sectional orientation. Subsequently, the region of interest is capped with a series of ex situ and in situ deposited layers to protect the nanowire and facilitate site-specific lift-out and cross-sectioning using a dual-beam FIB microscope. The lift-out specimen is thinned to electron transparency with site-specific positioning to within ∼200 nm of a target position along the length of the nanowire. Using the described technique, it is possible to produce correlated plan-view and cross-sectional view lattice-resolved TEM images that enable a quasi-3D analysis of crystalline defect structures in a specific nanowire. While the current study is focused on nanowires, the procedure described herein is general for any electron-transparent sample and is broadly applicable for many nanostructures, such as nanowires, nanoparticles, patterned thin films, and devices.

  • In Situ TEM Studies of Nanoparticle Growth in a Fluorozirconate (ZBLAN) Glass Matrix

  • M Vu, C Alvarez, Y Liu, A Petford-Long, J Johnson
  • Journal:
    Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
    Published online by Cambridge University Press:
    08 April 2017, pp. 496-497
    Print publication:
    July 2011
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-situ Lorentz TEM Study of Magnetic Domain Wall Mobility in Amartensitic Ni-Mn-Ga Alloy

  • A Budruk, C Pathak, A Petford-Long, M De Graef
  • Journal:
    Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
    Published online by Cambridge University Press:
    08 April 2017, pp. 1858-1859
    Print publication:
    July 2011
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Domain Observations in Fe-Pd-Co by Dynamic in-situ Lorentz TEM

  • A Budruk, C Phatak, AK Petford-Long, M De Graef
  • Journal:
    Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
    Published online by Cambridge University Press:
    01 August 2010, pp. 1236-1237
    Print publication:
    July 2010
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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