2 results
Non-Destructive Characterization of Porous Silicon Using X-Ray Reflectivity
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 321
- Print publication:
- 1994
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- Article
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In-Situ Ion Beam Measurements of Deuterium Loading in Thin Foil Electrochemical Cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 157 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 317
- Print publication:
- 1989
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- Article
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