7 results
Monitoring and Control in Vapor phase Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 502 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 117
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- 1997
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Simultaneous Monitoring of Wafer- and Environment-States During Molecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 441 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 761
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- 1996
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Continuum Elastic Strain Effects at Semiconductor Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 309
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- 1995
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Precision of Non-invasive Temperature Measurement by Diffuse Reflectance Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 69
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- 1995
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Strained Layer Semiconductor Films: Structure and Stability
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- Journal:
- MRS Online Proceedings Library Archive / Volume 102 / 1987
- Published online by Cambridge University Press:
- 26 February 2011, 405
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- 1987
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Optical Properties of Ordered Ge-Si Atomic-Layer Superlattices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 91 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 287
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- 1987
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Structure and Properties of Ultrathin Ge-Si Superlattices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 67 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 189
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- 1986
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