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Preparation and Characterization of Rare Rarth Scandate Thin Films as an Alternative gate dielectric
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- Journal:
- MRS Online Proceedings Library Archive / Volume 917 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0917-E05-10
- Print publication:
- 2006
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Strain Relaxation of He+ Implanted, Pseudomorphic Si1−xGex Layers on Si(100)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 696 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, N3.17
- Print publication:
- 2001
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- Article
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