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Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 996-997
- Print publication:
- August 2004
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- Article
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Understanding the structure of Si nanoclusters in a/nc-Si:H films using spherical aberration-corrected transmission electron microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 808 / 2004
- Published online by Cambridge University Press:
- 21 March 2011, A8.7
- Print publication:
- 2004
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- Article
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