9 results
The Oxide/Nitride Interface: a study for gate dielectrics and field passivation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E8.5
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- 2003
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Novel Oxides for Passivating AlGaN/GaN HEMT and Providing Low Surface State Densities at Oxide/GaN Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C4.1
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- 2003
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Growth of Scandium Magnesium Oxide on GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E8.6
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- 2003
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Electrical Properties of GaN/InGaN MQW Heterojunction Diodes as Affected by Various Plasma Treatments
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.16.1
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- 2001
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Electrical Properties of n-GaN/p-SiC and n-AlGaN/p-SiC Heterojunction Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.17.1
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- 2001
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Electrical Properties of n-GaN/p-SiC and n-AlGaN/p-SiC Heterojunction Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I6.8.1
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- 2001
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Electrical Characterization of GaN Metal Oxide Semiconductor Diode using Sc2O3 as the Gate Oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.47.1
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- 2001
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Electrical Characterization of GaN Metal Oxide Semiconductor Diodes Using MgO as the Gate Oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.30.1
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- 2001
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Proton Irradiation Effects on Scandium Oxide/Gallium Nitride MOS Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.31.1
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- 2001
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